中国科学院深圳先进技术研究院机构知识库(SIAT OpenIR): Defect Detection of using variant CNN in the processing of cover glass, touch screen and display under parallel light
SIAT OpenIR  > 南沙所
Defect Detection of using variant CNN in the processing of cover glass, touch screen and display under parallel light
Xiangying Wei; Qujiang Lei; Guangchao Gui; Shangzhi Le; Jiahao Zhong; Weijun Wang; Wei Feng
2020
Conference Name2020 IEEE 6th International Conference on Computer and Communications (ICCC)
Conference Date2020
Conference Place四川
AbstractDue to the development of mobile phone technology, the precision requirements for various parts of the mobile phone processing industry are getting higher and higher. Under the screen fingerprint, curved screen and other functions, so that the phone cover glass, touch screen, display processing needs micron-level precision. Although the production process to minimize dust, powder and other interference, but there will still be some product defects. This paper discusses how to do defect detection better in the processing of mobile phone screen, and proposes a defect detection method based on variant CNN to improve the detection accuracy.
Department南沙所-机器人中心
Indexed ByEI
Language英语
Document Type会议论文
Identifierhttp://ir.siat.ac.cn/handle/172644/18357
Collection南沙所
Recommended Citation
GB/T 7714
Xiangying Wei,Qujiang Lei,Guangchao Gui,et al. Defect Detection of using variant CNN in the processing of cover glass, touch screen and display under parallel light[C],2020.
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